Scanning Microscopy
Abstract
The secondary electron emission spectroscopy can provide useful information about the transitions in the electronic structure from solids and deals with the detection of fine structures superimposed on the true secondary peak, in the kinetic energy range of the true secondary electrons.
Several mechanisms have been proposed for the creation of these fine structures: diffraction phenomena, plasmon decay, interband transitions to unoccupied levels, Auger transitions and more recently, autoionization emission. Some features could not be explained as being due to any bulk effect and were considered as indicative of a need to include surface wave-matching arguments in the analysis of secondary electron emission spectra.
The authors give a review of the recent literature on the topic, including their own experience on the subject.
Recommended Citation
Cailler, Michel and Ganachaud, Jean-Pierre
(1990)
"Secondary Electron Emission from Solids. I. Secondary Electron Spectroscopy,"
Scanning Microscopy: Vol. 1990:
No.
4, Article 6.
Available at:
https://digitalcommons.usu.edu/microscopy/vol1990/iss4/6