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Scanning Microscopy

Volume 1990, Number 4 (1990) Fundamental Electron and Ion Beam Interactions with Solids for Microscopy, Microanalysis, and Microlithography

Articles

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Compton Scattering In Electron Energy Loss Spectrometry
P. Schattschneider, P. Pongratz, and H. Hohenegger

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Plasmons in Scanning Transmission Electron Microscopy Electron Spectra
R. H. Ritchie, A. Howie, P. M. Echenique, G. J. Basbas, T. L. Ferrell, and J. C. Ashley

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Electron Beam Nano-Etching in Oxides, Fluorides, Metals and Semiconductors
C. J. Humphreys, T. J. Bullough, R. W. Devenish, D. M. Maher, and P. S. Turner

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Slowing Down of Positrons and Applications to Solid Surfaces
Peter J. Schultz, L. R. Logan, W. N. Lennard, and G. R. Massoumi

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Slowing Down and Scattering of Ions in Solids
W. Heiland, H. Derks, and T. Bremer

This is the proceedings of the 8th Pfefferkorn Conference. Held May 7-12, 1989 at Park City, Utah.