Image-Matching as a Means of Atomic Structure Evaluation in High Resolution Transmission Electron Microscopy

Authors

John C. Barry, University of Queensland, Australia

Abstract

Two of the major applications of the high resolution transmission electron microscope (HRTEM) image-matching technique are: a) to refine the structure of defects and interfaces in crystals, and b) to identify minority phases in multi-phase materials. An important advantage of the technique is that it provides spatial information at the atomic level; but an important disadvantage is that the results are often hard to quantify. There are many factors which affect the precision of the image-matching technique, and methods for measuring the pertinent experimental parameters are discussed in this paper. It is shown that if the experimental parameters are known, then semi-quantitative image-matching can be used to unambiguously refine crystal defect structure.

Recommended Citation

Barry, John C. (1992) "Image-Matching as a Means of Atomic Structure Evaluation in High Resolution Transmission Electron Microscopy," Scanning Microscopy: Vol. 1992: No. 6, Article 20.
Available at: https://digitalcommons.usu.edu/microscopy/vol1992/iss6/20