Scanning Microscopy


Two of the major applications of the high resolution transmission electron microscope (HRTEM) image-matching technique are: a) to refine the structure of defects and interfaces in crystals, and b) to identify minority phases in multi-phase materials. An important advantage of the technique is that it provides spatial information at the atomic level; but an important disadvantage is that the results are often hard to quantify. There are many factors which affect the precision of the image-matching technique, and methods for measuring the pertinent experimental parameters are discussed in this paper. It is shown that if the experimental parameters are known, then semi-quantitative image-matching can be used to unambiguously refine crystal defect structure.

Included in

Biology Commons