Two of the major applications of the high resolution transmission electron microscope (HRTEM) image-matching technique are: a) to refine the structure of defects and interfaces in crystals, and b) to identify minority phases in multi-phase materials. An important advantage of the technique is that it provides spatial information at the atomic level; but an important disadvantage is that the results are often hard to quantify. There are many factors which affect the precision of the image-matching technique, and methods for measuring the pertinent experimental parameters are discussed in this paper. It is shown that if the experimental parameters are known, then semi-quantitative image-matching can be used to unambiguously refine crystal defect structure.
Barry, John C.
"Image-Matching as a Means of Atomic Structure Evaluation in High Resolution Transmission Electron Microscopy,"
Scanning Microscopy: Vol. 1992
, Article 20.
Available at: https://digitalcommons.usu.edu/microscopy/vol1992/iss6/20