Scanning Microscopy
Volume 1993, Number 7 (1993) Physics of Generation and Detection of Signals Used for Microcharacterization
Articles
Fractal Description of Electron Scattering in Solids: Several New Results and a Simple Modelization of the Fractal Dimension
Raynald Gauvin and Dominique Drouin
Anisotropic Secondary Electron Emission from Si(100) Surface Observed by Ultrahigh Vacuum Scanning Electron Microscopy
Yoshikazu Homma
A Few Steps Towards a More Quantitative Understanding of Contrast in the Scanning Electron Microscope
F. Hasselbach and U. Maier
Efficiency of the Secondary Electron Detector in the Scanning Electron Microscope
Zbigniew Czyzewski and David C. Joy
Energy Loss Function and Source Function for Au 4f Photoelectrons Derived by Monte Carlo Analysis of Reflection Electron Energy Loss Spectroscopy (REELS) and X-Ray Photoelectron Spectroscopy (XPS) Spectra
H. Yoshikawa, T. Tsukamoto, and R. Shimizu
Monte Carlo Simulation of X-Ray Spectra from Rh- and Cu-Targets Generated by kV-Electrons
K. Araki, Y. Kimura, and R. Shimizu
Spectral Decomposition of Wavelength Dispersive X-Ray Spectra: Implications for Quantitative Analysis in the Electron Probe Microanalyzer
G. Remond, J. L. Campbell, R. H. Packwood, and M. Fialin
Standardless Quantitative Analysis by X-Ray Spectrometry
János L. Lábár
A Survey of Electron Probe Microanalysis Using Soft Radiations: Difficulties and Presentation of a New Computer Program for Wavelength Dispersive Spectrometry
M. Fialin, J. Hénoc, and G. Remond
Electron Probe X-Ray Microanalysis Applied to Thin Surface Films and Stratified Specimens
J. L. Pouchou and F. Pichoir
Synchrotron Radiation Induced X-Ray Microanalysis: A Realistic Alternative for Electron- and Ion-Beam Microscopy?
K. Janssens, F. C. Adams, M. L. Rivers, and K. W. Jones
Recent Developments in Multichannel Raman Microprobing
J. Barbillat, M. Delhaye, and E. Da Silva
X-Ray Topography
A. Zarka
Applications of Charge Collection Microscopy: Electron-Beam-Induced Current to Semiconductor Materials and Device Research
Richard J. Matson
Transmission Electron Microscopy and Nanoprobe Analysis of Ferroelectric Thin Films
Maria Huffman, Mowafak M. Al-Jassim, and Chuck Echer
Computation of Scanning Tunneling Microscope Images of Nanometer-Sized Objects Physisorbed on Metal Surfaces
J. P. Vigneron, I. Derycke, Th. Laloyaux, Ph. Lambin, and A. A. Lucas
Surface Chemical Reactions at the Atomic Scale: Gas Reactions with Semiconductors Studied with Scanning Tunneling Microscopy
R. S. Becker, Y. J. Chabal, G. S. Higashi, and A. J. Becker
This is the proceedings of the 11th Pfefferkorn Conference. Held August 9 to 14, 1992 at University of Massachussetts, Amherst.