Imaging of Magnetic Microstructures at Surfaces: The Scanning Electron Microscope with Spin Polarization Analysis

Authors

H. P. Oepen, Institut für Grenzflächenforschung und Vakuumphysik Forschungszentrum Jülich
J. Kirschner, Institut für Experimentalphysik

Abstract

The scanning electron microscope with spin polarization analysis of secondary electrons has been proven to be a powerful tool for studying magnetic microstructures. Secondary electrons created at the surface of a ferromagnet are spin-polarized and contain information about the sample magnetization and its orientation. The combination of a spin polarization analyzer with a scanning electron microscope yields an unique apparatus for probing magnetic properties on a very small lateral scale. The magnetic resolution of < 40 nm is demonstrated. This type of microscope provides high magnetic contrast, while the surface morphology is strongly or even totally suppressed. The capability of studying magnetic properties of semi- infinite samples as well as in ultrathin films is demonstrated with a Fe(lOO) single crystal, video tape, CoCr perpendicular recording medium and ultrathin cobalt films.

Recommended Citation

Oepen, H. P. and Kirschner, J. (1991) "Imaging of Magnetic Microstructures at Surfaces: The Scanning Electron Microscope with Spin Polarization Analysis," Scanning Microscopy: Vol. 5: No. 1, Article 1.
Available at: https://digitalcommons.usu.edu/microscopy/vol5/iss1/1