Scanning Microscopy
Abstract
Modifications to the standard operating settings for accelerating voltage , condenser lens current, scan rate, working distance and tilt on the conventional scanning electron microscope (SEM) enabled non-metal coated dental hard tissues and synthetic apatite pellets to be viewed free of charging effects . Well -resolved images at magnifications as high as 35,000x were achieved using accelerating voltages less than 5 kV . The methodology detailed here allowed for serial SEM examination of the same sample at various points during an experimental procedure , and may be applied to other sample types. The procedure is non-destructive to the sample and requires no physical modification to the microscope.
Recommended Citation
McCormack, S. M.; Tormo, F. J.; and Featherstone, J. D. B.
(1990)
"A Straightforward Scanning Electron Microscopy Technique for Examining Non-Metal Coated Dental Hard Tissues,"
Scanning Microscopy: Vol. 5:
No.
1, Article 25.
Available at:
https://digitalcommons.usu.edu/microscopy/vol5/iss1/25