Scanning Microscopy


Modifications to the standard operating settings for accelerating voltage , condenser lens current, scan rate, working distance and tilt on the conventional scanning electron microscope (SEM) enabled non-metal coated dental hard tissues and synthetic apatite pellets to be viewed free of charging effects . Well -resolved images at magnifications as high as 35,000x were achieved using accelerating voltages less than 5 kV . The methodology detailed here allowed for serial SEM examination of the same sample at various points during an experimental procedure , and may be applied to other sample types. The procedure is non-destructive to the sample and requires no physical modification to the microscope.

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