Scanning Microscopy
Abstract
We describe an inexpensive addition to an existing cathodoluminescence system: Spectrally resolved transmission cathodoluminescence (SRTCL). In this technique, we couple the light emerging from beneath the sample into a vacuum compatible fiber optic cable for spectral dispersion by a conventional spectrometer. This simple approach represents a new development in the area of cathodoluminescence characterization. This exploratory study describes the preliminary results of this effort. We have applied SRTCL to the evaluation of InGaAs quantum wells, grown by molecular beam epitaxy, in vertical cavity surface emitting lasers. Results thus far support the viability of the technique. We also discuss the difficulties experienced to date and provide suggestions for future system improvements.
Recommended Citation
Myhajlenko, S.; Wong, M.; Edwards, J. L. Jr.; Maracas, G. N.; and Roedel, R. J.
(1992)
"Spectrally Resolved Transmission Cathodoluminescence Evaluation of Vertical Cavity Surface Emitting Lasers,"
Scanning Microscopy: Vol. 6:
No.
4, Article 7.
Available at:
https://digitalcommons.usu.edu/microscopy/vol6/iss4/7