Document Type


Journal/Book Title/Conference

2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena

Publication Date




This work proposes an enhanced statistical model for DC dielectric breakdown properties, which incorporates both shallow and deep defect modes. By incorporating these physics-based concepts into a traditionally empirical model, its accuracy and utility can be extended.

Experimental/Modeling methods

Voltage step-up tests were performed for various polymeric films. The distributions of the breakdown fields are fit to standard two- and three-parameter Weibull distributions. These are extended for a dual defect model, with separate mean energies for shallow and deep level traps, using mixed Weibull distributions.


As shown in Fig 1, such enhanced physics-based statistical models can result in improved fits for various polymeric material data. The merits of generalizations to widely-used Weibull models are discussed.


Theories of DC breakdown, based on distributions of microscopic defects in disordered insulating materials can guide improvements to statistical methods used to characterize breakdown properties.