10th Spacecraft Charging and Technology Conference
This study presents electron-induced electron yield measurements from high-resistivity, high-yield materials to validate a model for the yield of uncharged insulators. These measurements are accomplished by using a low-fluence, pulsed incident electron beam and charge neutralization to minimize charge accumulation. Our measurements show large changes in total yield curves and yield decay curves, even for incident electron fluences of/mm2. We model the evolution of the yield as charge accumulates in the material in terms of electron re-capture based on the extended Chung-Everhart model of the electron emission spectrum. This model is used to explain anomalies measured in high yield ceramics, and to provide a method for determining the uncharged yield in highly insulating, high yield materials. Relevance of these results to spacecraft charging will also be discussed.
Ryan Hoffmann and JR Dennison, “Electron-Induced Electron Yields of Uncharged Insulating Materials” Proceedings of the 10th Spacecraft Charging and Technology Conference, (Biarritz, France, June 18-21, 2007). 14 pp.