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Title

The effect of low energy electron and UV/VIS radiation aging on the electron emission properties and breakdown of thin-film dielectrics

Document Type

Presentation

Journal/Book Title/Conference

The effect of low energy electron and UV/VIS radiation aging on the electron emission properties and breakdown of thin-film dielectrics

Publication Date

2004

Comments

8th IEEE Dielectrics and Electrical Insulation Society (DEIS) International Conference on Solid Dielectrics (ICSD), July 5-9, 2004, Toulouse, France.

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