Infrared Spectrophotometry Calibration Facilities at NIST

NIST’s Sensor Science Division (SSD) has recently implemented a number of improvements to its infrared spectrophotometry capabilities in support of existing and emerging requirements for higher accuracy optical property measurements of materials. These include spectral transmittance, reflectance, emittance and index of refraction of materials. The Fourier Transform Infrared Spectrophotometry (FTIS) laboratory includes two Fourier transform spectrometer – based systems, each with multiple setups for transmittance, reflectance and emittance of a variety of optical materials types, with complimentary and overlapping controlled critical parameter variability, including polarization, sample temperature, measurement geometry and wavelength. A separate refractometer facility designed for high accuracy index of refraction measurements has also recently been extended from the ultraviolet into the infrared. We will report on these new developments, along with example calibration results on some key materials.