Sensor calibration and characterization relies on models, measurements, and analysis to provide the needed data to derive results while estimating errors and uncertainties show how well the results are understood.

Session Chair: Simon Kaplan, National Institute of Standards and Technology (NIST)

Schedule
2016
Wednesday, August 24th
2:05 PM

Streamlined Diffraction Corrections in Practical Radiometry

Eric Shirley, National Insitute of Standards and Technology (NIST)
Simon Kaplan, National Institute of Standards and Technology (NIST)
Solomon I. Woods, National Institute of Standards and Technology (NIST)
Adriaan Carter, Jung Research and Development
Timothy Jung, Jung Research and Development

2:05 PM
2:30 PM

JPSS1 VIIRS RSB Sensor Calibration Using Monochromater-based and Laser-based Methods

Jinan Zeng, Fibertek, Inc.
Tom Schwarting, Science Systems and Applications Inc. (SSAI)
Jeff McIntire, Science Systems and Applications Inc. (SSAI)
Jack Ji, Science Systems and Applications Inc. (SSAI)
Hassan Oudrari, Science Systems and Applications Inc. (SSAI)
Jack Xiong, NASA Goddard Space Flight Center
Jim Butler, NASA Goddard Space Flight Center

2:30 PM
2:55 PM

Uncertainty Budget of the Airborne Imaging Spectrometer APEX

A. Hueni, University of Zurich
E. Woolliams, National Physical Laboratory

2:55 PM
3:20 PM

Radiometric Calibration of an Ultra-compact Micro-bolometer Thermal Camera

David Riesland, Montana State University
Paul Nugent, Montana State University
Seth Laurie, Montana State University
Joseph Shaw, Montana State University

3:20 PM