Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System
Document Type
Article
Journal/Book Title/Conference
Lecture Notes in Computer Science
Volume
12863
Publisher
Springer
Publication Date
8-19-2021
Funder
NSF
First Page
232
Last Page
248
Abstract
Modern network-on-chip (NoC) systems face reliability issues due to process and environmental variations. The power supply noise (PSN) in the power delivery network of a NoC plays a key role in determining reliability. PSN leads to voltage droop, which can cause timing errors in the NoC. This paper makes a novel contribution towards formally analyzing PSN in NoC systems. We present a probabilistic model checking approach to analyze key features of PSN at the behavioral level in a 2 × 2 mesh NoC with a uniform random traffic load. To tackle state explosion, we apply incremental abstraction techniques, including a novel probabilistic choice abstraction, based on observations of NoC behavior. The Modest Toolset is used for probabilistic modeling and verification. Results are obtained for several flit injection patterns to reveal their impacts on PSN. Our analysis finds an optimal flit pattern generation with zero probability of PSN events and suggests spreading flits rather than releasing them in consecutive cycles in order to minimize PSN.
Recommended Citation
Roberts, R. et al. (2021). Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System. In: Lluch Lafuente, A., Mavridou, A. (eds) Formal Methods for Industrial Critical Systems. FMICS 2021. Lecture Notes in Computer Science(), vol 12863. Springer, Cham. https://doi.org/10.1007/978-3-030-85248-1_16
