Document Type
Conference Paper
Journal/Book Title/Conference
Proceedings of the International Symposium on Low Power Electronics and Design
Publisher
Association for Computing Machinery
Publication Date
7-23-2018
Abstract
SRAM-based PUFs (SPUFs) have emerged as promising security primitives for low-power devices. However, operating 8T-SPUFs at Near-Threshold Computing (NTC) realm is plagued by exacerbated process variation (PV) sensitivity which thwarts their reliable operation. In this paper, we demonstrate the massive degradation in the reliability and uniformity characteristics of 8T-SPUF. By exploiting the opportunities bestowed by schematic asymmetry of 8T-SPUF cells, we propose biasing and sizing based design strategies. Our techniques achieve an immense improvement of more than 55% in the percentage of unreliable cells and improves the proximity to ideal uniformity by 82%, over a baseline NTC 8T-SPUF with no enhancement.
Recommended Citation
Pramesh Pandey, Asmita Pal, Koushik Chakraborty and Sanghamitra Roy, Reliability and Uniformity Enhancement in 8T-SRAM based PUFs operating at NTC. Proceedings of the IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), Article 7, pp. -6, July 2018, Seattle, WA.
Comments
© 2018 This is the author's version of the work. It is posted here for your personal use. Not for redistribution. The definitive Version of Record was published in {Source Publication}, http://dx.doi.org/10.1145/3218603.3218642."