Document Type
Poster
Journal/Book Title/Conference
College of Engineering Senior Design Projects
Publisher
Utah State University
Location
Logan, UT
Publication Date
2021
Abstract
The Double Pulse MOSFET tester is a system used to characterize losses in Silicon-Carbide (SiC) high-power MOSFET semiconductor devices.
- Improve characterization of SiC switching losses
- Allow for better educated design decisions for power converters using these devices
- Perform automated sweeps of operating conditions across voltage, current, and temperature
Objectives:
- Test switching losses for SiC XM3 half bridge MOSFET modules
- Improve understanding of losses in SiC MOSFETs
- Allow for more informed decisions for power converters using these devices
Recommended Citation
Simpson, Craig, "Double Pulse MOSFET Tester" (2021). Electrical and Computer Engineering. Paper 173.
https://digitalcommons.usu.edu/eceengr_srdesign/173