Scanning Electron Microscopy
Volume 1982, Number 1 (1982) Electron Beam Interactions With Solids for Microscopy, Microanalysis, & Microlithography
Articles
Cross Sections for Inelastic Scattering of Electrons by Atoms - Selected Topics Related to Electron Microscopy
Mitio Inokuti and Steven T. Manson
Inelastic Scattering of Electrons in Solids
C. J. Powell
Secondary Electron Emission
Hellmut Seiler
Analytical Models in Electron Backscattering
Heinz Niedrig
Interaction of Electron Beam with the Target in Scanning Electron Microscope
Koichi Kanaya and Susumu Ono
Gaussian Models for the Energy Distribution of Excitation in Solids: Applications to X-Ray Microanalysis and Solid State Electronics
David B. Wittry
Backscattering of Electrons from Complex Structures
M. Kisza, Z. Maternia, and Zbigniew Radzimski
Some Applications of the Electron Backscattering Diffusion Model
W. Czarczyński and Z. Radzimski
Monte Carlo Electron Trajectory Calculations of Electron Interactions in Samples with Special Geometries
Dale E. Newbury and Robert L. Myklebust
Direct Monte Carlo Simulation of kV Electron Scattering Processes-N(E) Spectra for Aluminum
Ryuichi Shimizu and Shingo Ichimura
Monte Carlo Calculations on Electron Backscattering in Amorphous or Polycrystalline Targets
G. Soum, H. Ahmed, F. Arnal, B. Jouffrey, and P. Verdier
Monte Carlo Calculations on the Spatial and Angular Distributions of High Energy Electron Beams in Amorphous and Polycrystalline Films
J. L. Balladore, J. P. Martinez, J. Trinquier, and B. Jouffrey
A Transport Equation Theory of Electron Scattering
D. J. Fathers and P. Rez
Inelastic and Elastic Multiple Scattering of Fast Electrons Described by the Transport Equation
Karl E. Hoffmann and Hans Schmoranzer
Electron Scattering and Energy Losses as a Function of the Incident Energy: Application to Chemical Analysis
Bernard Jouffrey
Detectors for Electron Energy Spectroscopy
David C. Joy
Analytical Scanning Electron Microscopy for Surface Science
Olive Lee-Deacon, Claude Le Gressus, and Daniel Massignon
An Investigation of the Maximum Specimen Thickness for Differential Phase Contrast Lorentz Microscopy
R. P. Ferrier, G. R. Morrison, and J. N. Chapman
Backscattered Electron (BSE) Imaging in the Scanning Electron Microscope (SEM) - Measurement of Surface Layer Mass-Thickness
Oliver C. Wells, Richard J. Savoy, and Phillip J. Bailey
Electron Beam Induced Chemistry of Lithographic Materials
Jacob Pacansky, Adolfo Gutierrez, and Richard Kroeker
Reduction of Electron Beam Induced Radiation Damage of Organic Material by Cooling to 4 K (Cryo Electron Microscopy)
I. Dietrich, E. Knapek, and G. Lefranc
This is the proceedings of the 1st Pfefferkorn Conference. Held April 18 to 23, 1982, at the Asilomar Conference Center, Monterey, CA.