Date of Award:
5-2012
Document Type:
Thesis
Degree Name:
Master of Science (MS)
Department:
Electrical and Computer Engineering
Committee Chair(s)
Koushik Chakraborty
Committee
Koushik Chakraborty
Committee
Sanghamitra Roy
Committee
Edmund Spencer
Abstract
Negative Bias Temperature Instability (NBTI) is becoming a major reliability problem in the semiconductor industry. As time passes, NBTI reduces the capacity of performing correct computations in the microprocessor. Hence, after certain time period, the microprocessor may fail to work as we expect, causing failure of the entire system it is part of. In this research, we study the root cause of the failure due to NBTI effect. Based on our findings, we propose multiple methods to reduce the negative impact of NBTI on a microprocessor. We build a comprehensive experimental setup to consider real world effects in a microprocessor. We evaluate our methods against the previous work and find that our methods substantially improve the processor reliability. This research could be useful in the future to extend lifetime of the processor.
Checksum
9576e30acf3b016cd8f4adbdd57926b5
Recommended Citation
Kothawade, Saurabh, "Design of Negative Bias Temperature Instability (NBTI) Tolerant Register File" (2012). All Graduate Theses and Dissertations, Spring 1920 to Summer 2023. 1160.
https://digitalcommons.usu.edu/etd/1160
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Comments
This work made publicly available electronically on April 10, 2012.