Document Type

Article

Journal/Book Title/Conference

Journal of Applied Physics

Volume

111

Issue

10

Publisher

AIP Publishing

Publication Date

2012

Abstract

A photothermal technique capable of measuring thermal conductivity with micrometer lateral resolution is presented. This technique involves measuring separately the thermal diffusivity, D, and thermal effusivity, e, to extract the thermal conductivity, k = (e2/D)1/2. To generalize this approach, sensitivity analysis is conducted for materials having a range of thermal conductivities. Application to nuclear fuel is consider by performing experimental validation using two materials (CaF2 and SiO2) having thermal properties representative of fresh and high burnup nuclear fuel. The measured conductivities compare favorably with literature values.

Comments

Publisher's version can be accessed at: http://aip.scitation.org/doi/full/10.1063/1.4716474

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