Document Type
Article
Journal/Book Title/Conference
Proceedings of the 2024 IEEE Conference on Electrical Insulation and Dielectric Phenomena
Publisher
Institute of Electrical and Electronics Engineers
Publication Date
10-2024
First Page
1
Last Page
6
Abstract
Measured permittivity of thin film polymeric samples were substantially less for thin samples, asymptotically approaching bulk values above ~500 μm. For ~25 μm samples the observed permittivities were as much as 50% less than for bulk measurements. This behavior has been studied for four common homogeneous polymeric materials for sample thickness in the range of ~10 μm to > 1000 μm. To quantify these observations, an empirical single-parameter model was developed to correct measured permittivity of thin samples based on an effective stray capacitance in series with the samples to compensate for effects attributed to instrumentation.
Recommended Citation
Dennison, JR and Eggleston, Cameron, "Modeling Permittivity Measurements of Thin Film Materials Versus Film Thickness" (2024). Journal Articles. Paper 60.
https://digitalcommons.usu.edu/mp_facpub/60