The Significance of Surface Roughness in Electron Yield Data

Authors

Christopher Vega, Utah State University
Matthew Robertson, Utah State UniversityFollow
Trace Taylor, Utah State University
Heather Allen, Utah State University
JR Dennison, Utah State UniversityFollow

Document Type

Poster

Journal/Book Title/Conference

American Physical Society Four Corners Meeting

Location

Logan, UT

Publication Date

10-20-2023

Recommended Citation

Christopher Vega, Matthew Robertson, Trace Taylor, Heather Allen, and JR Dennison, “The Significance of Surface Roughness in Electron Yield Data,” American Physical Society Four Corners Meeting, Utah State University, Logan, UT, October 20-21, 2023.