Characterization of Electron Yield Suppression with Carbon Nanotube Forest Grown on Silicon Substrates

Authors

Brian Wood, Utah State UniversityFollow
Jordan Lee, Utah State UniversityFollow
Justin Christensen, Utah State University
Gregory Wilson, Utah State UniversityFollow
JR Dennison, Utah State UnivesityFollow
T. -C. Shen, Utah State UniversityFollow

Document Type

Presentation

Journal/Book Title/Conference

Fall 2018 Four Corner Section Meeting of the American Physical Society

Location

Salt Lake City, UT

Publication Date

10-12-2018

Recommended Citation

Wood, Brian; Lee, Jordan; Christensen, Justin; Wilson, Gregory; Dennison, JR; and Shen, T. -C., "Characterization of Electron Yield Suppression with Carbon Nanotube Forest Grown on Silicon Substrates" (2018). Fall 2018 Four Corner Section Meeting of the American Physical Society. Presentations. Paper 176.
https://digitalcommons.usu.edu/mp_presentations/176