Document Type
Presentation
Journal/Book Title/Conference
Fall 2018 Four Corner Section Meeting of the American Physical Society
Location
Salt Lake City, UT
Publication Date
10-12-2018
Recommended Citation
Wilson, Gregory; Robertson, Matthew; Lee, Jordan; and Dennison, JR, "Electron Yield Measurements of Multilayer Conductive Materials" (2018). Fall 2018 Four Corner Section Meeting of the American Physical Society. Presentations. Paper 178.
https://digitalcommons.usu.edu/mp_presentations/178