Electron Yield Analysis of Different Surface Morphologies

Authors

Matthew Robertson, Utah State UniversityFollow
Christopher Vega
Trace Taylor
Dallen DeWaal
JR Dennison, Utah State UniversityFollow

Document Type

Presentation

Journal/Book Title/Conference

American Physical Society Four Corners Meeting

Location

Logan, UT

Publication Date

10-20-2023

Recommended Citation

Matthew Robertson, Christopher Vega, Trace Taylor, Dallen DeWaal and JR Dennison, “Electron Yield Analysis of Different Surface Morphologies,” American Physical Society Four Corners Meeting, Utah State University, Logan, UT, October 20-21, 2023.