Modeling the Effects of Surface Roughness on Electron Yield

Authors

Trace Taylor
Matthew Robertson, Utah State UniversityFollow
JR Dennison, Utah State UniversityFollow

Document Type

Presentation

Journal/Book Title/Conference

16th Spacecraft Charging Technology Conference

Location

Cocoa Beach, FL

Publication Date

4-4-2022

Recommended Citation

Trace Taylor, Matthew Robertson and JR Dennison, “Modeling the Effects of Surface Roughness on Electron Yield,” 16th Spacecraft Charging Technology Conference, (Cocoa Beach FL, USA, April 4-8, 2022).