Characterization of an ultra-dense 2DEG confined to a d-layer of P in single-crystal Si

Authors

M. A. Zudov
R. -R. Du
T. C. Shen, Utah State UniversityFollow

Document Type

Presentation

Publication Date

3-18-2002

Recommended Citation

Talk at APS-March meeting, Indianapolis, Indiana, 3/18/2002. “Characterization of an ultra-dense 2DEG confined to a d-layer of P in single-crystal Si,” presented by M. A. Zudov, R-R Du, and T- C Shen