The Effect of Voltage Ramp Rate on Dielectric Breakdown of Thin Film Polymers

Authors

Anthony Thomas
John R. Dennison, Utah State UniversityFollow
Steve Hart
R. C. Hoffmann

Document Type

Presentation

Journal/Book Title/Conference

The Effect of Voltage Ramp Rate on Dielectric Breakdown of Thin Film Polymers

Publication Date

2006

Comments

American Physical Society Four Corner Section Meeting, Utah State University, Logan, UT

Recommended Citation

Anthony Thomas, JR Dennison, Steve Hart and RC Hoffmann, “The Effect of Voltage Ramp Rate on Dielectric Breakdown of Thin Film Polymers,’ American Physical Society Four Corner Section Meeting, Utah State University, Logan, UT, October 6-7, 2006.