The effect of low energy electron and UV/VIS radiation aging on the electron emission properties and breakdown of thin-film dielectrics

Authors

John R. Dennison, Utah State UniversityFollow
C. D. Thomson
Alec Sim, Utah State UniversityFollow

Document Type

Presentation

Journal/Book Title/Conference

The effect of low energy electron and UV/VIS radiation aging on the electron emission properties and breakdown of thin-film dielectrics

Publication Date

2004

Comments

8th IEEE Dielectrics and Electrical Insulation Society (DEIS) International Conference on Solid Dielectrics (ICSD), July 5-9, 2004, Toulouse, France.

Recommended Citation

JR Dennison, C. D. Thomson, and Alec Sim, “The effect of low energy electron and UV/VIS radiation aging on the electron emission properties and breakdown of thin-film dielectrics,” 8th IEEE Dielectrics and Electrical Insulation Society (DEIS) International Conference on Solid Dielectrics (ICSD), July 5-9, 2004, Toulouse, France.