All Physics Faculty Publications
Document Type
Conference Paper
Journal/Book Title/Conference
Proceedings of the Society for Optics and Photonics
Volume
4774
Publisher
SPIE
Publication Date
2002
First Page
111
Last Page
118
Abstract
Molecular surface contaminants can cause degradation of optical systems, especially if the contaminants exhibit strong absorption bands in the region of interest. Different strategies for estimation of spectral degradation responses due to uniform films for various types of systems are reviewed. One tool for calculating the effects of contaminant film thickness on signal degradation in the mid IR region is the simulation program CALCRT. The CALCRT database will be reviewed to correlate spectral n and k values associated with specific classes of organic functional groups. Various schemes are also investigated to estimate the spectral degradation in the UV-Vis region. Experimental measurements of reflectance changes in the IR to UV-Vis regions due to specific contaminants will be compared. Approaches for estimating changes in thermal emissivity and solar absorptivity will also be discussed.
Recommended Citation
Lara Gamble ; J. R. Dennison ; Bob E. Wood ; James J. Herrick ; James S. Dyer; Calculation of spectral degradation due to contaminant films on infrared and optical sensors. Proc. SPIE 4774, Optical System Contamination: Effects, Measurements, and Control VII, 111 (September 6, 2002); doi:10.1117/12.481667.
Comments
Copyright 2002 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
http://dx.doi.org/10.1117/12.481667