All Physics Faculty Publications

Document Type

Conference Paper

Journal/Book Title/Conference

Proceedings of the Society for Optics and Photonics

Volume

4774

Editor

Philip T. Chen, O. Manuel Uy

Publisher

SPIE

Publication Date

2002

First Page

111

Last Page

118

DOI

10.1117/12.481667

Abstract

Molecular surface contaminants can cause degradation of optical systems, especially if the contaminants exhibit strong absorption bands in the region of interest. Different strategies for estimation of spectral degradation responses due to uniform films for various types of systems are reviewed. One tool for calculating the effects of contaminant film thickness on signal degradation in the mid IR region is the simulation program CALCRT. The CALCRT database will be reviewed to correlate spectral n and k values associated with specific classes of organic functional groups. Various schemes are also investigated to estimate the spectral degradation in the UV-Vis region. Experimental measurements of reflectance changes in the IR to UV-Vis regions due to specific contaminants will be compared. Approaches for estimating changes in thermal emissivity and solar absorptivity will also be discussed.

Comments

Copyright 2002 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

http://dx.doi.org/10.1117/12.481667

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