An Improved 3 Omega Measurement of Anisotropic Thin Film Material.
Class
Article
College
College of Engineering
Faculty Mentor
Nick Roberts
Presentation Type
Poster Presentation
Abstract
Due to the size of the nano-scale and micro-scale materials, traditional method for measuring the thermal properties of the bulk materials cannot be applied. The 3 Omega Method was developed by D. G. Cahill in the early 90s. It was used extensively to measure the thermal properties of thin film dielectric materials. Compare with other simulations or experimental methods, the 3 Omega Method has many advantages. Previous research has indicate that the 3 Omega method is capable of measuring the cross-plane thermal conductivity of thin film materials. In extension, an alternative improvement for calculating the difference between the thermal properties of in-plane and cross-plane (anisotropy) is developed based on the concept of the 3 Omega Method.
Location
The South Atrium
Start Date
4-12-2018 10:30 AM
End Date
4-12-2018 11:45 AM
An Improved 3 Omega Measurement of Anisotropic Thin Film Material.
The South Atrium
Due to the size of the nano-scale and micro-scale materials, traditional method for measuring the thermal properties of the bulk materials cannot be applied. The 3 Omega Method was developed by D. G. Cahill in the early 90s. It was used extensively to measure the thermal properties of thin film dielectric materials. Compare with other simulations or experimental methods, the 3 Omega Method has many advantages. Previous research has indicate that the 3 Omega method is capable of measuring the cross-plane thermal conductivity of thin film materials. In extension, an alternative improvement for calculating the difference between the thermal properties of in-plane and cross-plane (anisotropy) is developed based on the concept of the 3 Omega Method.