Session
Technical Session XIII: Poster Session
Abstract
Today's small satellites employ powerful microcircuits to control virtually every aspect of the spacecraft. While these small devices are very capable, they are increasingly vulnerable to heavy ion induced Single Event Upset (SEU). Current technology is not very susceptible to SEUs. The evolution of microdevices is toward lower power and higher speed while spacecraft evolve toward smaller and lighter structures. This combination, along with the increased heavy ion particle fluence associated with large solar flares, will cause tomorrow's microdevices to experience SEU at rates approaching 100 upsets per device per day! To ensure mission success, these small satellites must consider implementing one or more SEU mitigation techniques.
Microprocessor Technology and Single Event Upset Susceptibility
Today's small satellites employ powerful microcircuits to control virtually every aspect of the spacecraft. While these small devices are very capable, they are increasingly vulnerable to heavy ion induced Single Event Upset (SEU). Current technology is not very susceptible to SEUs. The evolution of microdevices is toward lower power and higher speed while spacecraft evolve toward smaller and lighter structures. This combination, along with the increased heavy ion particle fluence associated with large solar flares, will cause tomorrow's microdevices to experience SEU at rates approaching 100 upsets per device per day! To ensure mission success, these small satellites must consider implementing one or more SEU mitigation techniques.
