Session

Weekday Poster Session 2

Location

Utah State University, Logan, UT

Abstract

All electronic systems, no matter their type or technology, generate electromagnetic noise during operation. Conversely, all electronic systems are susceptible to the noise emissions of other systems, where these emissions can induce off-nominal system behaviour, potentially leading to system failure. This drives test procedure standardisation, to ensure confidence in test results, growing confidence in mission success by applying standards such as MIL-STD-461G [1]. However, all standards are based on assumptions which inherently limit their applicability. In the case of MIL-STD-461G, an underlying assumption is that the operating modes of the Device Under Test (DUT) reach steady-state quickly.

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Aug 6th, 1:30 PM

Electromagnetic Interactions Test Procedure for a Centre-Triggered Pulsed Cathodic Arc Thruster

Utah State University, Logan, UT

All electronic systems, no matter their type or technology, generate electromagnetic noise during operation. Conversely, all electronic systems are susceptible to the noise emissions of other systems, where these emissions can induce off-nominal system behaviour, potentially leading to system failure. This drives test procedure standardisation, to ensure confidence in test results, growing confidence in mission success by applying standards such as MIL-STD-461G [1]. However, all standards are based on assumptions which inherently limit their applicability. In the case of MIL-STD-461G, an underlying assumption is that the operating modes of the Device Under Test (DUT) reach steady-state quickly.