Document Type

Article

Journal/Book Title/Conference

IEEE Transactions on Plasma Science

Author ORCID Identifier

Zachary J. Gibson https://orcid.org/0000-0002-3939-4321

J. R. Dennison https://orcid.org/0000-0002-5504-3353

Publisher

IEEE

Publication Date

11-19-2025

Journal Article Version

Version of Record

First Page

1

Last Page

8

Abstract

Spacecraft charging issues are often investigated with simulated space environments and evaluated on pass–fail criteria that may yield little or no information about materials’ properties. It is far more effective to understand and mitigate spacecraft charging issues through investigations of material properties. However, material properties are dynamic in the harsh environment of space. Approximations must be made to simulate the space environment in the laboratory. This article reports on the investigation of the approximation that energy deposition causes the same aging effects in materials irrespective of the type of radiation sources. Samples of polytetrafluoroethylene (PTFE) and polyether-etherketone (PEEK) were irradiated with X-rays, γ-rays, or electrons at total ionizing dose (TID) of 2 × 102, 2 × 103, or 2 × 104 Gy, respectively. Charge was then injected in each sample with an 80-keV monoenergetic electron beam. The resulting charge distributions and charge transport properties were probed via pulsed electroacoustic (PEA) measurements. Samples were measured in a parallel plate capacitor configuration where they were first grounded, a dc bias was applied, and then grounded again. Thermal and structural properties were measured with differential scanning calorimetry (DSC). The results show at least three distinct phases of charge transport characteristics in PTFE, while PEEK showed no substantial changes at these TID. Observable differences in the DSC measurements were apparent for both PTFE and PEEK indicating enhanced crystallization with aging. The study suggests that dose rate may be the dominant factor as opposed to radiation type for aging in polymers.

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