All Physics Faculty Publications
Nanoscale oxide patterns on Si (100) surfaces
Document Type
Article
Journal/Book Title/Conference
Applied Physics Letters
Issue
66
Publication Date
1995
First Page
976
Last Page
978
Abstract
Ultrathin oxide patterns of a linewidth of 50 Å have been created on Si(100)‐2×1 surfaces by a scanning tunneling microscope operating in ultrahigh vacuum. The oxide thickness is estimated to be 4–10 Å. The morphology and spectroscopy of the oxide region are obtained. Hydrogen passivation is used as an oxidation mask. The defects caused by oxidation in the passivated region before and after the hydrogen desorption are compared and discussed. The multistep silicon processings by an ultrahigh vacuum scanning tunneling micropscope is thus demonstrated.
Recommended Citation
T.-C. Shen, C. Wang, J. W. Lyding and J. R. Tucker, "Nanoscale oxide patterns on Si (100) surfaces," Appl. Phys. Lett. 66, 976-978 (1995).
https://doi.org/10.1063/1.113817